"Measurement Analysis and Fault Proneness Indication in Product Line ..."

Zeeshan Ahmed (2007)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-14

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  - electronic edition @ iospress.nl
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  dblp key:
  - conf/somet/Ahmed07
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  persistent URL:
  - https://dblp.org/rec/conf/somet/Ahmed07
Zeeshan Ahmed:
Measurement Analysis and Fault Proneness Indication in Product Line Applications (PLA). SoMeT 2007: 391-400

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