"Zero-Aware Fine-Grained Power Gating for Standard-Cell Memories in ..."

Jun Shiomi et al. (2022)

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DOI: 10.1109/SOCC56010.2022.9908116

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-20

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Jun Shiomi, Shogo Terada, Tohru Ishihara, Hidetoshi Onodera:
Zero-Aware Fine-Grained Power Gating for Standard-Cell Memories in Voltage-Scaled Circuits. SOCC 2022: 1-6

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