"A method to estimate effectiveness of weak bit test: Comparison of weak ..."

Nidhi Batra et al. (2016)

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DOI: 10.1109/SOCC.2016.7905432

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Nidhi Batra, Shashwat Kaushik, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover:
A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation. SoCC 2016: 47-51

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