"A two-step Pansharpening of ETM+ TIR image based on SFIM and neural ..."

Min Han, Wei Yao (2009)

> Home

Details and statistics

DOI: 10.1109/ICSMC.2009.5346259

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/smc/HanY09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/smc/HanY09
Min Han, Wei Yao:
A two-step Pansharpening of ETM+ TIR image based on SFIM and neural network regression. SMC 2009: 1371-1375

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.