"Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC ..."

Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka (2020)

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DOI: 10.1109/SMC42975.2020.9283106

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-08

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Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels. SMC 2020: 2339-2344

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