"Analysis of optimization algorithms in automated test pattern generation ..."

Majed M. Alateeq, Witold Pedrycz (2017)

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DOI: 10.1109/SMC.2017.8122883

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Majed M. Alateeq, Witold Pedrycz:
Analysis of optimization algorithms in automated test pattern generation for sequential circuits. SMC 2017: 1834-1839

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