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"Comprehensive detection of counterfeit ICs via on-chip sensor and ..."
Yaoyao Ye et al. (2017)
- Yaoyao Ye, Taeyoung Kim
, Hai-Bao Chen, Hai Wang, Esteban Tlelo-Cuautle
, Sheldon X.-D. Tan:
Comprehensive detection of counterfeit ICs via on-chip sensor and post-fabrication authentication policy. SMACD 2017: 1-4
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