"Impact of interconnect length changes on effective materials properties ..."

Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand (2007)

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DOI: 10.1145/1231956.1231972

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand:
Impact of interconnect length changes on effective materials properties (dielectric constant). SLIP 2007: 73-80

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