"Defect Classification from Electronic Card Images by Deep Learning."

Mustafa Eryilmaz et al. (2022)

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DOI: 10.1109/SIU55565.2022.9864727

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-07

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Mustafa Eryilmaz, Metehan Çil, Sedat Aktürk, Mehmet Tilegi, Hakan Tirak, Atila Yilmaz, Seniha Esen Yüksel, Dinçer Gökcen:
Defect Classification from Electronic Card Images by Deep Learning. SIU 2022: 1-4

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