"Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality ..."

Tony F. Wu et al. (2021)

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DOI: 10.1109/SIPS52927.2021.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-17

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Tony F. Wu, Doyun Kim, Daniel H. Morris, Edith Beigné:
Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications. SiPS 2021: 1-3

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