"Atomistic Modelling and Simulation of Transmission Electron Microscopy ..."

Cyril Guedj et al. (2018)

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DOI: 10.5220/0006829200150024

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Cyril Guedj, Léonard Jaillet, François Rousse, Stéphane Redon:
Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene. SIMULTECH 2018: 15-24

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