"A Multidimensional Analysis of Bug Density in SAP HANA."

Julian Reck, Thomas Bach, Jan Stoess (2023)

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DOI: 10.1145/3611643.3613875

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-17

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Julian Reck, Thomas Bach, Jan Stoess:
A Multidimensional Analysis of Bug Density in SAP HANA. ESEC/SIGSOFT FSE 2023: 1997-2007

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