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"Easy over Hard: A Simple Baseline for Test Failures Causes Prediction."

Zhipeng Gao et al. (2024)

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DOI: 10.1145/3663529.3663850

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-19

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  dblp key:
  - conf/sigsoft/GaoX0S024
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  - https://dblp.org/rec/conf/sigsoft/GaoX0S024
Zhipeng Gao, Zhipeng Xue, Xing Hu, Weiyi Shang, Xin Xia:
Easy over Hard: A Simple Baseline for Test Failures Causes Prediction. SIGSOFT FSE Companion 2024: 306-317

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