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"Proceedings of the 2017 ACM SIGMETRICS / International Conference on ..."
Bruce E. Hajek et al. (2017)
- Bruce E. Hajek, Sewoong Oh, Augustin Chaintreau, Leana Golubchik, Zhi-Li Zhang:
Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017. ACM 2017, ISBN 978-1-4503-5032-7 [contents]
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