"Proceedings of the International Conference on Measurements and Modeling ..."

Derek L. Eager et al. (2005)

> Home

Details and statistics

DOI: 10.1145/1064212

access: closed

type: Editorship

metadata version: 2021-07-30

- view
  authority control:
- export record
  dblp key:
  - conf/sigmetrics/2005
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sigmetrics/2005
Derek L. Eager, Carey L. Williamson, Sem C. Borst, John C. S. Lui:
Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada. ACM 2005, ISBN 1-59593-022-1 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.