"SemML: Reusable ML for Condition Monitoring in Discrete Manufacturing."

Yulia Svetashova et al. (2020)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-10

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Yulia Svetashova, Baifan Zhou, Stefan Schmid, Tim Pychynski, Evgeny Kharlamov:
SemML: Reusable ML for Condition Monitoring in Discrete Manufacturing. ISWC (Demos/Industry) 2020: 213-218

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