"Ad hoc Test Generation Through Binary Rewriting."

Anthony Saieva, Shirish Kumar Singh, Gail E. Kaiser (2020)

> Home

Details and statistics

DOI: 10.1109/SCAM51674.2020.00018

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/scam/SaievaSK20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/scam/SaievaSK20
Anthony Saieva, Shirish Kumar Singh, Gail E. Kaiser:
Ad hoc Test Generation Through Binary Rewriting. SCAM 2020: 115-126

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.