"Generation of Tests for the Localization of Single Gate Design Errors in ..."

Raimund Ubar, Dominique Borrione (1998)

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DOI: 10.1109/SBCCI.1998.715409

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-27

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Raimund Ubar, Dominique Borrione:
Generation of Tests for the Localization of Single Gate Design Errors in Combinational Circuits using the Stuck-at Fault Model. SBCCI 1998: 51-54

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