"Improving Soft Error Robustness of Full Adder Circuits with Decoupling ..."

Rafael N. M. Oliveira et al. (2022)

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DOI: 10.1109/SBCCI55532.2022.9893240

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt:
Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. SBCCI 2022: 1-6

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