"Encountering gate oxide breakdown with shadow transistors to increase ..."

Claas Cornelius et al. (2008)

> Home

Details and statistics

DOI: 10.1145/1404371.1404407

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sbcci/CorneliusSSSTS08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sbcci/CorneliusSSSTS08
Claas Cornelius, Frank Sill, Hagen Sämrow, Jakob Salzmann, Dirk Timmermann, Diógenes Cecilio da Silva Jr.:
Encountering gate oxide breakdown with shadow transistors to increase reliability. SBCCI 2008: 111-116

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.