"Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low ..."

Soonhak Kwon, Chang Hoon Kim, Chun Pyo Hong (2004)

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DOI: 10.1007/978-3-540-30564-4_10

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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Soonhak Kwon, Chang Hoon Kim, Chun Pyo Hong:
Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity. Selected Areas in Cryptography 2004: 144-158

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