"A pattern-aware write strategy to enhance the reliability of flash-memory ..."

Tseng-Yi Chen et al. (2017)

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DOI: 10.1145/3019612.3019680

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Tseng-Yi Chen, Yuan-Hao Chang, Yuan-Hung Kuan, Ming-Chang Yang, Yu-Ming Chang, Pi-Cheng Hsiu:
A pattern-aware write strategy to enhance the reliability of flash-memory storage systems. SAC 2017: 1460-1466

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