"Automatic test data generation using particle systems."

Paulo Marcos Siqueira Bueno, W. Eric Wong, Mário Jino (2008)

> Home

Details and statistics

DOI: 10.1145/1363686.1363871

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sac/BuenoWJ08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sac/BuenoWJ08
Paulo Marcos Siqueira Bueno, W. Eric Wong, Mário Jino:
Automatic test data generation using particle systems. SAC 2008: 809-814

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.