"High Temperature Operating Lifetime Test on piezo-MEMS devices."

Maria Fortuna Bevilacqua et al. (2021)

> Home

Details and statistics

DOI: 10.1109/RTSI50628.2021.9597262

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/rtsi/BevilacquaCCFP21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/rtsi/BevilacquaCCFP21
Maria Fortuna Bevilacqua, Valeria Casuscelli, Sonia Costantini, Paolo Ferrari, Immacolata Pedaci:
High Temperature Operating Lifetime Test on piezo-MEMS devices. RTSI 2021: 452-456

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.