"A Test Cost Sensitive Heuristic Attribute Reduction Algorithm for ..."

Shengdan Hu et al. (2018)

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DOI: 10.1007/978-3-319-99368-3_20

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-31

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Shengdan Hu, Duoqian Miao, Zhifei Zhang, Sheng Luo, Yuanjian Zhang, Guirong Hu:
A Test Cost Sensitive Heuristic Attribute Reduction Algorithm for Partially Labeled Data. IJCSR 2018: 257-269

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