"Effect of Gate Dielectric Thickness on the Performance of Top-Down ZnO ..."

Nor Azlin Ghazali et al. (2021)

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DOI: 10.1007/978-981-16-8129-5_105

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-01

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  - conf/rovisp/GhazaliMAC21
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Nor Azlin Ghazali, Mohamed Fauzi Packeer Mohamed, Muhammad Firdaus Akbar, Harold M. H. Chong:
Effect of Gate Dielectric Thickness on the Performance of Top-Down ZnO Nanowire Field-Effect Transistors. RoViSP 2021: 690-696

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