"The Classification of Wafer Defects: A Support Vector Machine with ..."

Lim Shi Xuen et al. (2022)

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DOI: 10.1007/978-3-031-26889-2_27

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/rita/XuenKRMYJYM22
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  - https://dblp.org/rec/conf/rita/XuenKRMYJYM22
Lim Shi Xuen, Ismail Mohd Khairuddin, Mohd Azraai Mohd Razman, Jessnor Arif Mat-Jizat, Edmund Yuen, Haochuan Jiang, Eng Hwa Yap, Anwar P. P. Abdul Majeed:
The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. RiTA 2022: 304-309

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