"RFID testing and evaluation for an RF-harsh environment."

Allison J. Mercer et al. (2011)

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DOI: 10.1109/RFID-TA.2011.6068622

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Allison J. Mercer, Ryan K. James, Gisele Bennett, Priyank Patel, Chase Johnston, James Cai:
RFID testing and evaluation for an RF-harsh environment. RFID-TA 2011: 95-102

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