"A new local homogeneity analysis method based on pixel intensities for ..."

Rajitha Bakthula, Anjana Tiwari, Suneeta Agarwal (2015)

> Home

Details and statistics

DOI: 10.1109/RETIS.2015.7232878

access: closed

type: Conference or Workshop Paper

metadata version: 2018-05-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/retis/RajithaTA15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/retis/RajithaTA15
Rajitha Bakthula, Anjana Tiwari, Suneeta Agarwal:
A new local homogeneity analysis method based on pixel intensities for image defect detection. ReTIS 2015: 200-206

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.