"Automatic Test Pattern Generation for Multiple Missing Gate Faults in ..."

Anmol Prakash Surhonne, Anupam Chattopadhyay, Robert Wille (2017)

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DOI: 10.1007/978-3-319-59936-6_14

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-26

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Anmol Prakash Surhonne, Anupam Chattopadhyay, Robert Wille:
Automatic Test Pattern Generation for Multiple Missing Gate Faults in Reversible Circuits - Work in Progress Report. RC 2017: 176-182

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