"Reducing Mid-Circuit Measurements via Probabilistic Circuits."

Yanbin Chen, Innocenzo Fulginiti, Christian B. Mendl (2024)

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DOI: 10.1109/QCE60285.2024.00114

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-24

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Yanbin Chen, Innocenzo Fulginiti, Christian B. Mendl:
Reducing Mid-Circuit Measurements via Probabilistic Circuits. QCE 2024: 952-958

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