"A Semi-supervised Defect Detection Method Based on Image Inpainting."

Huibin Cao et al. (2021)

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DOI: 10.1007/978-3-030-89370-5_8

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-05

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Huibin Cao, Yongxuan Lai, Quan Chen, Fan Yang:
A Semi-supervised Defect Detection Method Based on Image Inpainting. PRICAI (3) 2021: 97-108

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