"A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching ..."

Yuta Yamato et al. (2009)

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DOI: 10.1109/PRDC.2009.21

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara:
A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. PRDC 2009: 81-86

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