"Reliability Estimation of Approximate Circuits Based on Probabilistic Gate ..."

Tao Wang, Jianhui Jiang, Zhen Wang (2019)

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DOI: 10.1109/PRDC47002.2019.00023

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-06

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Tao Wang, Jianhui Jiang, Zhen Wang:
Reliability Estimation of Approximate Circuits Based on Probabilistic Gate Model. PRDC 2019: 55-56

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