"Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network."

Long Cheng et al. (2019)

> Home

Details and statistics

DOI: 10.1007/978-3-030-31726-3_31

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/prcv/ChengGQWL19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/prcv/ChengGQWL19
Long Cheng, Ping Gong, Guanghui Qiu, Jing Wang, Ziyuan Liu:
Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network. PRCV (3) 2019: 366-377

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.