"Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE."

Edith Heiter et al. (2024)

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DOI: 10.1007/978-3-031-70371-3_24

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-20

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  - https://dblp.org/rec/conf/pkdd/HeiterMSGBSL24
Edith Heiter, Liesbet Martens, Ruth Seurinck, Martin Guilliams, Tijl De Bie, Yvan Saeys, Jefrey Lijffijt:
Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE. ECML/PKDD (8) 2024: 379-382

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