"Applying Machine Learning Models on Metrology Data for Predicting Device ..."

Bappaditya Dey et al. (2023)

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DOI: 10.1007/978-3-031-74640-6_36

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-14

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  - conf/pkdd/DeyNSB0H23
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  - https://dblp.org/rec/conf/pkdd/DeyNSB0H23
Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Victor Blanco, Philippe Leray, Sandip Halder:
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. PKDD/ECML Workshops (4) 2023: 435-453

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