"Regret Analysis for Performance Metrics in Multi-Label Classification: The ..."

Krzysztof Dembczynski et al. (2010)

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DOI: 10.1007/978-3-642-15880-3_24

access: open

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Krzysztof Dembczynski, Willem Waegeman, Weiwei Cheng, Eyke Hüllermeier:
Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss. ECML/PKDD (1) 2010: 280-295

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