"Deep F-Measure Maximization in Multi-label Classification: A Comparative ..."

Stijn Decubber et al. (2018)

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DOI: 10.1007/978-3-030-10925-7_18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Stijn Decubber, Thomas Mortier, Krzysztof Dembczynski, Willem Waegeman:
Deep F-Measure Maximization in Multi-label Classification: A Comparative Study. ECML/PKDD (1) 2018: 290-305

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