"Parallel test generation using circuit partitioning and spectral techniques."

Consolación Gil, Julio Ortega (1998)

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DOI: 10.1109/EMPDP.1998.647208

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/pdp/GilO98
Consolación Gil, Julio Ortega:
Parallel test generation using circuit partitioning and spectral techniques. PDP 1998: 264-270

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