"Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time."

Nestor Ioannidis, Ioannis Voyiatzis (2009)

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DOI: 10.1109/PCI.2009.41

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Nestor Ioannidis, Ioannis Voyiatzis:
Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time. Panhellenic Conference on Informatics 2009: 55-59

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