"Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and ..."

C. R. Parthasarathy et al. (2007)

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DOI: 10.1007/978-3-540-74442-9_19

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-04

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C. R. Parthasarathy, Alain Bravaix, Chloe Guérin, Mickael Denais, Vincent Huard:
Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation. PATMOS 2007: 191-200

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