"Reliability monitoring of digital circuits by in situ timing measurement."

Nasim Pour Aryan, Georg Georgakos, Doris Schmitt-Landsiedel (2013)

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DOI: 10.1109/PATMOS.2013.6662168

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Nasim Pour Aryan, Georg Georgakos, Doris Schmitt-Landsiedel:
Reliability monitoring of digital circuits by in situ timing measurement. PATMOS 2013: 150-156

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