"Novel Opto-Electronical Probe Card for Wafer-Level PIC Testing."

Tobias Gnausch et al. (2019)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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  dblp key:
  - conf/ofc/GnauschGJKBF19
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  - https://dblp.org/rec/conf/ofc/GnauschGJKBF19
Tobias Gnausch, Armin Grundmann, Thomas Juhasz, Thomas Kaden, Robert Buttner, Thilo von Freyhold:
Novel Opto-Electronical Probe Card for Wafer-Level PIC Testing. OFC 2019: 1-3

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