"Realities and Challenges of III-V/Si Integration Technologies."

John E. Bowers et al. (2019)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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John E. Bowers, Duanni Huang, Daehwan Jung, Justin Norman, Minh A. Tran, Yating Wan, Weiqiang Xie, Zeyu Zhang:
Realities and Challenges of III-V/Si Integration Technologies. OFC 2019: 1-3

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