"A novel memory test system with an electromagnet for STT-MRAM testing."

Ryo Tamura et al. (2019)

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DOI: 10.1109/NVMTS47818.2019.8986200

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Ryo Tamura, N. Watanabe, Hiroki Koike, Hideo Sato, Shoji Ikeda, Tetsuo Endoh, Soshi Sato:
A novel memory test system with an electromagnet for STT-MRAM testing. NVMTS 2019: 1-4

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