"Charge Trapping and Endurance Degradation in Ferroelectric Field-Effect ..."

Dominik Kleimaier et al. (2024)

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DOI: 10.1109/IEEECONF63530.2024.10830836

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-30

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Dominik Kleimaier, Stefan Dünkel, Halid Mulaosmanovic, Johannes Müller, Sven Beyer, Viktor Havel, Thomas Mikolajick:
Charge Trapping and Endurance Degradation in Ferroelectric Field-Effect Transistors. NVMTS 2024: 1-5

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