"Conventional and deep feature oriented quality inspection of internal ..."

Sourav Dey Roy, Dipak Hrishi Das, Mrinal Kanti Bhowmik (2019)

> Home

Details and statistics

DOI: 10.1145/3362966.3362969

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/nsyss/RoyDB19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/nsyss/RoyDB19
Sourav Dey Roy, Dipak Hrishi Das, Mrinal Kanti Bhowmik:
Conventional and deep feature oriented quality inspection of internal defected eggs using infrared imaging. NSysS 2019: 12-20

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.