"The Complexity of Testing Cryptographic Devices on Input Faults."

Alisher Ikramov, Gayrat Juraev (2021)

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DOI: 10.1007/978-3-030-92708-0_12

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Alisher Ikramov, Gayrat Juraev:
The Complexity of Testing Cryptographic Devices on Input Faults. NSS 2021: 202-209

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