"Automated Test Case Generation with SMT-Solving and Abstract Interpretation."

Jan Peleska, Elena Vorobev, Florian Lapschies (2011)

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DOI: 10.1007/978-3-642-20398-5_22

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Jan Peleska, Elena Vorobev, Florian Lapschies:
Automated Test Case Generation with SMT-Solving and Abstract Interpretation. NASA Formal Methods 2011: 298-312

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